期刊
IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING
卷 10, 期 3, 页码 571-578出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TASE.2013.2243433
关键词
Cross-domain modeling and validation; nanomanufacturing; nanostructure growth; physical mechanism selection
资金
- National Science Foundation [CMMI-1002580]
Understanding nanostructure growth faces issues of limited data, lack of physical knowledge, and large process uncertainties. These issues result in modeling difficulty because a large pool of candidate models almost fit the data equally well. Through the Integrated Nanomanufacturing and Nanoinformatics (INN) strategy, we derive the process models from physical and statistical domains, respectively, and reinforce the understanding of growth processes by identifying the common model structure across two domains. This cross-domain model building strategy essentially validates models by domain knowledge rather than by (unavailable) data. It not only increases modeling confidence under large uncertainties, but also enables insightful physical understanding of the growth kinetics. We present this method by studying the weight growth kinetics of silica nanowire under two temperature conditions. The derived nanowire growth model is able to provide physical insights for prediction and control under uncertainties.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据