3.8 Article

Accurate Characterization of Broadband Multiconductor Transmission Lines for High-Speed Digital Systems

期刊

IEEE TRANSACTIONS ON ADVANCED PACKAGING
卷 33, 期 4, 页码 857-867

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TADVP.2010.2050204

关键词

DC transmission line parameters; de-embedding technique for multiconductor transmission lines; generalized conversion formula from S-parameter to RLGC; vector network analyzer (VNA) and time-domain reflectometry (TDR) measurements

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Accurate modeling of transmission lines becomes increasingly important in high-speed interconnect system design. However, it is rather difficult to obtain broadband transmission line models, in particular using frequency-domain measurements. This paper points out two potential accuracy issues. First, inaccurate DC values of the frequency-domain data cause a severe error in the time-domain simulations. Second, it is difficult to characterize the characteristic impedance over a wide frequency range due to the reflection caused by the port discontinuities. This paper proposes the combination of both time and frequency measurement data to mitigate the DC accuracy issue. For the characteristic impedance model, a new de-embedding technique is presented to mitigate the port discontinuity issue. Several numerical examples, such as MCM-L coplanar lines and package microstrip lines, are studied to validate the accuracy of the proposed method.

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