Fiber-Based White-Light Interferometry for Nanoscale Distance Measurement and Control

We present a fiber-based white-light interferometry system capable of nanoscale distance measurement and control. Our prototype contains two cleaved single mode fibers tightly clamped together. Using a supercontinuum white-light source, we can achieve distance control with a standard deviation of <4 nm. This method is potentially suitable for applications that require noncontact measurements or that involve highly deformable structures.