期刊
IEEE PHOTONICS TECHNOLOGY LETTERS
卷 23, 期 5, 页码 290-292出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LPT.2010.2103305
关键词
Bragg gratings; sampled gratings; silicon-on-insulator; strip waveguides
资金
- Natural Sciences and Engineering Research Council of Canada
We have demonstrated uniform and sampled Bragg gratings in silicon-on-insulator strip waveguides with symmetric sidewall corrugations. The fabrication is based on 193-nm deep ultraviolet lithography using a single mask. The measured reflection spectra of sampled gratings exhibit ten usable peaks spaced by 4.2 nm, and show good agreement with theoretical predictions.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据