4.6 Article Proceedings Paper

Miniaturized BJT-Based Thermal Sensor for Microprocessors in 32- and 22-nm Technologies

期刊

IEEE JOURNAL OF SOLID-STATE CIRCUITS
卷 48, 期 11, 页码 2860-2867

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JSSC.2013.2280039

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Analog; CPU hot-spots; Intel; microprocessors; thermal management; thermal sensors

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A thermal sensor is proposed for microprocessors, which compares the BJT voltage to a reference by converting both voltages to frequency and dividing the frequencies to result in a digital number. The sensor has an rms resolution of +/-0.2C and an area of 0.02 mm(2) at the 32-nm process node and 0.006 mm(2) at 22 nm, including all digital processing circuitry. The conversion rate is between 2-20 kS/s, which enables it to capture fast transients on the CPU. It consumes 3.8/1.4 mW at 32/22 nm from an unregulated 1.4-V supply. The combination of speed, low power, and area make this sensor appropriate to measure hot-spots in microprocessors.

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