期刊
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS
卷 25, 期 2, 页码 -出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JSTQE.2018.2868795
关键词
Surface plasmon resonance; MoS2; optical sensor; refractive index
资金
- Singapore A*STAR AME IRG [A1783c0011]
- USA Air Force Office of Scientific Research through the Asian Office of Aerospace Research and Development [FA2386-17-1-4020]
A surface plasmon resonance refractive index sensor based on MoS2-aluminium structure is designed for high imaging sensitivity and detection accuracy. The proposed sensor exhibits better performance than graphene-based refractive index sensor in the near-infrared regime. Ahigh imaging sensitivity ofmore than 970 RIU-1 is obtained at the wavelength of 1540 nm. The effect of aluminium thickness, number of MoS2 layers, and the analyte refractive index on the sensor performance was investigated. In addition, the sensor performance comparison of MoS2 and other two-dimensional transition metal dichalcogenide materials-based sensors in the near-infrared regime is also presented. The designed MoS2-based surface plasmon resonance refractive index sensor could provide potential applications in chemical and biological sensing.
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