4.4 Article

Multicolor ITO/SiOx/p-Si/Al Light Emitting Diodes with Improved Emission Efficiency by Small Si Quantum Dots

期刊

IEEE JOURNAL OF QUANTUM ELECTRONICS
卷 47, 期 5, 页码 698-704

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JQE.2011.2109699

关键词

Electroluminescence; metal oxide semiconductor diode; Si quantum dots; Si-rich SiOx

资金

  1. National Science Council, Taiwan
  2. National Taiwan University, Taiwan [NSC 99-2622-E-002-024-CC2, NSC 98-2622-E-002-023-CC3, NSC 100-2623-E-002-002-ET, 99R80306]

向作者/读者索取更多资源

In this paper, multicolor ITO/SiOx/p-Si/Al light emitting diodes (LEDs) made by Si quantum dot (Si-QD) embedded Si-rich SiOx grown by detuning the radio frequency (RF) plasma power under the plasma-enhanced chemical vapor deposition system are presented. With the Si-QD size shrinkage obtained by increasing the RF plasma powers from 30 to 70 W, the turn-on voltage of red, green, and blue ITO/SiOx/pSi/Al LEDs is found to increase from 70 to 99 V, with the maximum electroluminescent power increasing from 9 to 423 nW. The corresponding power-current slope and power conversion ratio are observed to greatly increase from 0.6 to 28 mW/A and from 8 x 10(-6) to 2.4 x 10(-4), respectively. The power-current conversion ratio of the ITO/SiOx/p-Si/Al LEDs increased with decreasing Si-QD size, indicating that the carrier recombination rate is much higher in the smaller Si-QDs, which was corroborated with the carrier lifetime analysis. On the contrary, the carrier accumulation results of the multicolor ITO/SiOx/pSi/Al LEDs obtained by using C-V hysteresis analysis show the opposite trend to that of the power-current conversion ratio. It is observed that the bigger Si-QDs exhibit a higher capability for carrier storage and the charge loss rate is degraded by two orders of magnitude when the Si-QD size shrinks from 4.1 (largest) to 1.8 (smallest) nm.

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