期刊
IEEE ELECTRON DEVICE LETTERS
卷 33, 期 4, 页码 525-527出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2012.2186116
关键词
AlN; contact resistance; GaN; high-electron-mobility transistor (HEMT); InAlN; metal-organic chemical vapor deposition (MOCVD); molecular beam epitaxy (MBE); regrowth; transistor
资金
- Defense Advanced Research Projects Agency [HR0011-10-C-0015]
- Air Force Office of Scientific Research
- Office of Naval Research
Nonalloyed ohmic contacts regrown by molecular beam epitaxy were made on InAlN/AlN/GaN/SiC high-electron-mobility transistors ( HEMTs). Transmission-line-method measurements were carried out from 4 K to 350 K. Although the total contact resistance is dominated by the metal/n(+)-GaN resistance (similar to 0.16 Omega . mm), the resistance induced by the interface between the regrown n(+) GaN and HEMT channel is found to be 0.05-0.075 Omega . mm over the entire temperature window, indicating a minimal barrier for electron flow at the as-regrown interface. The quantum contact resistance theory suggests that the interface resistance can be further reduced to be < 0.02 Omega . mm in GaN HEMTs.
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