4.6 Article

Enhanced Current Drivability of CVD Graphene Interconnect in Oxygen-Deficient Environment

期刊

IEEE ELECTRON DEVICE LETTERS
卷 32, 期 11, 页码 1591-1593

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2011.2166240

关键词

Breakdown; current density; failure mechanism; graphene; interconnect

资金

  1. Mid-career Researcher Program
  2. National Research Foundation
  3. Korea government (MEST) [20110000072, 2010-0019122, R31-2008-000-10026-0]
  4. National Research Foundation of Korea [R31-2011-000-10026-0, 2009-0082128] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

向作者/读者索取更多资源

Graphene has been considered as a candidate for interconnect metal due to its high carrier mobility and current drivability. In this letter, the breakdown mechanism of single-layer chemical-vapor-deposited (CVD) graphene and triple-layer CVD graphene has been investigated at three different conditions (air exposed, vacuum, and dielectric capped) to identify a failure mechanism. In vacuum, both single-and triple-layer graphenes demonstrated a breakdown current density as high as similar to 10(8) A/cm(2), which is similar to that of exfoliated graphene. On the other hand, the breakdown current of graphene exposed to air was degraded by one order of magnitude from that of graphene tested in vacuum. Thus, oxidation initiated at the defect sites of CVD graphene was suggested as a major failure mechanism in air, while Joule heating was more dominant with dielectric capping and in vacuum.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据