期刊
IEEE ELECTRON DEVICE LETTERS
卷 31, 期 5, 页码 476-478出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2010.2041893
关键词
Resistive random access memory (RRAM); resistive switching; temperature instability
资金
- A*STAR [092-151-0086]
In this letter, the temperature instability of HfOx-based resistive switching memory is investigated. It is observed that with the increase of high temperature (up to 100 degrees C in this work), the leakage current of high-resistance state would increase, and the set/reset voltages would decrease. In addition, multibit switching exhibited at room temperature might not be retained with the increase of temperature. All these phenomena can be correlated with oxygen-vacancy-related trap formation and annihilation.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据