4.6 Article

The Zero-Temperature-Coefficient Point Modeling of DTMOS in CMOS Integration

期刊

IEEE ELECTRON DEVICE LETTERS
卷 31, 期 10, 页码 1071-1073

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2010.2057404

关键词

DTMOS; modeling; strain; zero temperature coefficient (ZTC)

资金

  1. National Science Council, Taiwan [NSC-97-2221-E-009-153-MY3]

向作者/读者索取更多资源

For the first time, analytical expressions of zero-temperature-coefficient (ZTC) point modeling of DTMOS transistor are successfully presented in detail. New analytical formulations for the linear and saturation regions of DTMOS transistor operation that make certain the drive current to be temperature independent for the ideal gate voltage are developed. The maximum errors of 0.87% and 2.35% in the linear and saturation regions, respectively, confirm a good agreement between our DTMOS ZTC point model and the experimental data. Compared to conventional MOSFET, the lower V(g) (ZTC) with higher overdrive current of DTMOS improves the integrated circuit speed and efficiency for the low-power-consumption concept in green CMOS technology.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据