4.6 Article

Unlimited high breakdown voltage by natural super junction of polarized semiconductor

期刊

IEEE ELECTRON DEVICE LETTERS
卷 29, 期 10, 页码 1087-1089

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2008.2002753

关键词

breakdown voltage; GaN; heterojunction field-effect transistor (HFET); piezoelectric; polarization; Schottky barrier diode (SBD); simulation; super junction

向作者/读者索取更多资源

A breakdown mechanism of polarized semiconductors represented by GaN-based materials is presented, based on the concept of a natural super junction, which is established by the inherent material polarization. In this concept, owing to the precise matching of positive and negative polarizations of both sides of GaN and AlGaN materials, average charge concentration in the material becomes nearly zero under reverse bias condition, which realizes extremely high breakdown voltage. This model is confirmed by device simulation taking all polarization charges of GaN-based materials into account. Furthermore, experimentally fabricated GaN-based Schottky barrier diodes showed a linear increase of breakdown voltage along the anode-cathode spacing, achieving a record breakdown voltage over 9000 V.

作者

我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。

评论

主要评分

4.6
评分不足

次要评分

新颖性
-
重要性
-
科学严谨性
-
评价这篇论文

推荐

暂无数据
暂无数据