A Thin Wave Absorber Using Closely Placed Divided Conductive Film and Resistive Film

In this letter, the design for a thin wave absorber using an admittance sheet composed of closely placed resistive film and divided conductive film is studied. The admittance of the sheet has frequency dependence because of the mutual influence between the films. The matching frequency of the absorber depends on its thickness (< lambda/4) and susceptance of the sheet. Likewise, the reflection value at the frequency depends on conductance of the sheet. The effects of the parameters of the resistive film and the divided conductive film on the admittance characteristics of the sheet were investigated. Then, the design procedure for the absorber was discussed. The tendency of measured reflection characteristics agreed well with the simulated ones.