Recommendations for using XRF core scanning as a tool in tephrochronology

X-ray fluorescence (XRF) core scanning is a relatively new arrangement of a classic analytical technique which allows for non-destructive, in situ XRF analysis of sediment cores from submillimetre resolution upwards. In this contribution we explore the use of XRF core scanning for tephrochronology based on the analysis of three gyttja-rich sediment cores from the Faroe Islands. Using a combination of optical and radiographic images, analytical parameters and elemental profiles (Si, K, Ca, Ti, Mn, Fe, Sr and Zr), higher concentration basaltic tephra layers (>1000 shards/cm(3)) were positively identified. The XRF core scanning did not capture the lower concentration (<850 shards/cm(3)) rhyolitic layers found in the core. The elemental data generated for the detected tephra layers using XRF core scanning was not comparable to individual shard analysis by electron microprobe. We recommend using XRF core scanning for tephra screening in order to localize depths for high-resolution subsampling and to avoid depths where sediment mixing has caused tailing/mixing of the tephra signal. At the studied site the basaltic Saksunarvatn ash as well as a tephra belonging to the Askja-S/10 ka eruption were identified.