Journal
FORENSIC SCIENCE INTERNATIONAL
Volume 210, Issue 1-3, Pages 16-25Publisher
ELSEVIER IRELAND LTD
DOI: 10.1016/j.forsciint.2011.01.029
Keywords
Atomic force microscopy (AFM); Force mapping; Nanotechnology; Pressure sensitive adhesive (PSA); Mechanical properties; Items of recovery
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Funding
- University of Abertay Dundee (UAD)
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Pressure sensitive adhesive (PSA), such as those used in packaging and adhesive tapes, are very often encountered in forensic investigations. In criminal activities, packaging tapes may be used for sealing packets containing drugs, explosive devices, or questioned documents, while adhesive and electrical tapes are used occasionally in kidnapping cases. In this work, the potential of using atomic force microscopy (AFM) in both imaging and force mapping (FM) modes to derive additional analytical information from PSAs is demonstrated. AFM has been used to illustrate differences in the ultrastructural and nanomechanical properties of three visually distinguishable commercial PSAs to first test the feasibility of using this technique. Subsequently, AFM was used to detect nanoscopic differences between three visually indistinguishable PSAs. (C) 2011 Elsevier Ireland Ltd. All rights reserved.
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