Journal
EXPERIMENTAL MECHANICS
Volume 53, Issue 3, Pages 505-512Publisher
SPRINGER
DOI: 10.1007/s11340-012-9639-8
Keywords
Deformation measurement; Speckle pattern; Digital image correlation; Subpixel registration algorithm; Optimal subset size
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Funding
- National Basic Research Program of China [2011CB809106]
- National Natural Science Foundation of China [11002003, 11072004]
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A novel subpixel registration algorithm with Gaussian windows is put forward for accurate deformation measurement in digital image correlation technique. Based on speckle image quality and potential deformation states, this algorithm can automatically minimize the influence of subset sizes by self-adaptively tuning the Gaussian window shapes with the aid of a so-called weighted sum-of-squared difference correlation criterion. Numerical results of synthetic speckle images undergoing in-plane sinusoidal displacement fields demonstrate that the proposed algorithm can significantly improve displacement and strain measurement accuracy especially in the case with relatively large deformation.
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