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The identification, characterization and mitigation of defect states in organic photovoltaic devices: a review and outlook

Journal

ENERGY & ENVIRONMENTAL SCIENCE
Volume 6, Issue 12, Pages 3414-3438

Publisher

ROYAL SOC CHEMISTRY
DOI: 10.1039/c3ee41860j

Keywords

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Funding

  1. National Science Foundation [1055930]
  2. Div Of Electrical, Commun & Cyber Sys
  3. Directorate For Engineering [1055930] Funding Source: National Science Foundation

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In any microelectronic device, fundamental physical parameters must be well understood for successful electronic optimization. One such prominent parameter is energetic trap states, which are well-known to plague amorphous or otherwise impure semiconducting materials. Organic semiconductors are no strangers to such states and their electronic properties are evidently tied to these defects. Herein, this article discusses the identification, characterization and mitigation of bandgap residing trap levels in organic photovoltaic devices. A compilation of select studies to date is given and a general outlook is proposed. Organic photovoltaic materials are depicted as multiple trap-level systems with a seemingly continuous distribution of electronic states throughout the bandgap. Some elucidations as to the origins of these electronic states as well as recent works centered on defect removal are also presented.

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