Journal
JOURNAL OF POLYMER SCIENCE PART B-POLYMER PHYSICS
Volume 54, Issue 2, Pages 128-134Publisher
WILEY
DOI: 10.1002/polb.23802
Keywords
neutron scattering; additives; conducting polymers; Fullerenes; interpenetrating networks (IPN); small angle neutron scattering (SANS); P3HT:PCBM
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Funding
- National Research Foundation of Korea (NRF) - Korea Ministry of Science, ICT and Future Planning (MSIP) [2010-0018290]
- Brain Korea Plus Program in SNU Chemical Engineering
- WCU Program of Chemical Convergence for Energy and Environment [R31-10013]
- Technology Development Program to Solve Climate Changes [NRF-2009-C1AAA001-2009-0093282]
- IRTG [2011-0032203]
- National Research Foundation of Korea [2010-0018290, 2009-0093319, 2012M2A2A6004260] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)
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Morphology of the active layer in an organic photovoltaic (OPV) device is known to have a significant impact on the device performance. It is, however, difficult to characterize nanoscale morphologies in detail, especially at the ensemble level. Herein, we report the utilization of small angle neutron scattering (SANS) to investigate variations in the nanoscale morphologies of the active layer of poly(3-hexylthiophene-2,5-diyl):[6,6]-phenyl-C61-butyric acid methyl ester (P3HT:PCBM) bulk heterojunction OPV depending on the composition of casting solvent. Both the power law and the poly hard sphere model were utilized to characterize the state of the donor and acceptor components, respectively, from the obtained SANS data. Furthermore, the relationship between the nanoscale morphology and device performance is outlined. It was found that the use of 2-chlorophenol, a poor solvent for P3HT and, at the same time, a very good solvent for PCBM, leads to nanomorphology featuring ordered, highly crystalline P3HT and small (15.2 nm) PCBM domains. (C) 2015 Wiley Periodicals, Inc.
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