Journal
JOURNAL OF PHYSICS-CONDENSED MATTER
Volume 28, Issue 1, Pages -Publisher
IOP PUBLISHING LTD
DOI: 10.1088/0953-8984/28/1/015602
Keywords
electronic topological transition; high pressure; Raman spectroscopy; resistivity
Categories
Funding
- CSIR
- DST [SR/S2/RJN-24/2010]
- PAC on CMPMS [SB/S2/CMP-019/2014]
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We report the high-pressure vibrational properties and a pressure-induced electronic topological transition in the wide bandgap semiconductor Sb2S3 (E-g = 1.7-1.8 eV) using Raman spectroscopy, resistivity and x-ray diffraction (XRD) studies. In this report, high-pressure Raman spectroscopy and resistivity studies of Sb2S3 have been carried out to 22 GPa and 11 GPa, respectively. We observed the softening of phonon modes A(g)(2), A(g)(3) and B-2g and a sharp anomaly in their line widths at 4 GPa. The resistivity studies corroborate this anomaly around similar pressures. The changes in resistivity as well as Raman line widths can be ascribed to the strong phonon-phonon coupling, indicating clear evidence of isostructural electronic topological transition in Sb2S3. The previously reported pressure dependence of a/c ratio plot obtained also showed a minimum at similar to 5 GPa consistent with our high-pressure Raman and resistivity results.
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