4.6 Article

Low temperature electrodeposition of SiOx films photoactive in water solution

Journal

ELECTROCHIMICA ACTA
Volume 108, Issue -, Pages 112-117

Publisher

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.electacta.2013.06.112

Keywords

Silicon; Silicon oxide; Electrodeposition; Photoanode; Photoelectrolysis

Funding

  1. Foundation of Polish Science [MPD Program/2008/01]
  2. EU European Regional Development Fund
  3. Polish Ministry of Science and Higher Education [N N204 117039]
  4. CePT project [POIG.02.02.00-14-024/08-00]

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We report a low temperature, an electrochemical way of preparation of a photoanode made of n-type silicon oxide based films, at which surface photoelectrochemical oxygen evolution was observed with no need to deposit of other materials. Conditions of electrosynthesis, under which the electrochemical reduction of silicon chlorides in non aqueous solutions leads to silicone oxide based films are described. The photoactivity of prepared photo-anodes was reproducible and the observed photocurrent sustained for many hours. The most stable photocurrent was observed for films deposited at -2.7 V. Water oxidation was observed while occurring at the onset potentials smaller than 0.2 V comparing to the dark water splitting potential. The highest photocurrent was observed at -0.3 V (thermodynamic value 1.02V vs. Ag wire), which means energy saving corresponding to ca. 1.3 V. The results demonstrate that a low temperature electrodeposition of silicon oxide based films can be an alternative route for fabrication of photoanode for water photosplitting devices. (C) 2013 Elsevier Ltd. All rights reserved.

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