Journal
ELECTROCHEMISTRY COMMUNICATIONS
Volume 46, Issue -, Pages 13-17Publisher
ELSEVIER SCIENCE INC
DOI: 10.1016/j.elecom.2014.05.024
Keywords
Electrochemical passivation; Hard X-ray Photoelectron Spectroscopy (HAXPES); Al alloys; Complex metallic alloys; Composition depth profiling; Oxide/hydroxide
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A Hard X-ray Photoelectron Spectroscopy (HAXPES) characterisation of the passivation layers formed by electrochemical polarisation of Al-Cr-Fe complex metallic alloys is presented. By employing X-ray excitation energies from 2.3 to 10.0 keV, the depth distributions of Al- and Cr-oxide and hydroxide species in the (Al,Cr)-containing passive layers could be determined. Simultaneous analyses of the shallow Al 2s and deep Al 1s core level lines (respectively, more bulk- and surface-sensitive) provided complementary information to effectively determine the depth-resolved contributions of hydroxide and oxide species within the passivation layer. A Cr threshold concentration of 18 (at.%) was found for effective passivation at pH 1. (C) 2014 Elsevier B.V. All rights reserved.
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