4.6 Article

A method to measure electron lifetime in dye-sensitized solar cells: Stepped current induced measurement of cell voltage in the dark

Journal

ELECTROCHEMISTRY COMMUNICATIONS
Volume 13, Issue 12, Pages 1420-1422

Publisher

ELSEVIER SCIENCE INC
DOI: 10.1016/j.elecom.2011.09.005

Keywords

Charge recombination; Voltage transient; Current transient

Funding

  1. MEXT, Japan [21750015]
  2. Grants-in-Aid for Scientific Research [21750015] Funding Source: KAKEN

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The lifetime of electrons in the semiconductor electrode of dye-sensitized solar cells (DSSCs) is an important parameter determining the energy conversion efficiency. We propose a method to determine the electron lifetime by stepped current induced measurement of cell voltage in the dark (darkSCIM). Since this technique does not require the creation of photoinduced charges, the lifetime of devices with poorly injecting dyes, or indeed values for devices, which employ no sensitizer, can be determined. (C) 2011 Elsevier B.V. All rights reserved.

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