Journal
JOURNAL OF PHYSICAL CHEMISTRY C
Volume 119, Issue 23, Pages 12910-12915Publisher
AMER CHEMICAL SOC
DOI: 10.1021/jp512055g
Keywords
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Funding
- Ministry of Science and Technology, Taiwan [MOST 102-2112-M-029-005-MY3]
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Synchrotron radiation soft X-ray was employed to reduce graphene oxide (GO) films in ultrahigh vacuum. The dissociation of oxygen-containing functional groups, and the formation of sp(2) C-C bonds were revealed by time-resolved in situ X-ray photoelectron spectroscopy, demonstrating the X-ray reduction of GO. The number of C-O bonds of G-O exhibited an exponential decay with exposure time. The X-ray reduction rate of G-O was positively correlated with the intensity of low-energy secondary electrons excited from substrates by soft X-ray, indicating the C-O bonds were dissociated by secondary electrons.
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