Journal
JOURNAL OF PHYSICAL CHEMISTRY C
Volume 119, Issue 17, Pages 9253-9259Publisher
AMER CHEMICAL SOC
DOI: 10.1021/jp512695c
Keywords
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Funding
- Ile-de-France Region (Photoemission Environnementale en Ile-de-France, SESAME) [090003524]
- Agence Nationale de la Recherche (Surfaces under Ambient Pressure with Electron Spectroscopies) [ANR- 08-BLAN-0096]
- Universite Pierre et Marie Curie
- LABEX MiChem (UPMC)
- Synchrotron SOLEIL
- Agence Nationale de la Recherche (ANR) [ANR-08-BLAN-0096] Funding Source: Agence Nationale de la Recherche (ANR)
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Using synchrotron radiation Near-Ambient Pressure X-ray photoemission spectroscopy (NAP-XPS) in surface and bulk sensitive conditions, we specifically explored the depth distribution of Na+ ions near the vapor/liquid interface of saturated solutions of sodium halides (NaCl, NaBr, and NaI) kept at 278 K under a pressure of 8 mbar. By varying the photoelectron kinetic energy, and hence the probing depth, we show that the Na+ depth distribution near the surface is highly sensitive to the size and polarizability of the anion. The large polarizable anions, Br- and I- that segregate at the surface, tend to drag the Na+ ions closer to the liquid-water surface. However, this situation is not observed for the NaCl solution, in line with recent theoretical results.
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