4.8 Article

Photocurrents in a Single In As Nanowire/Silicon Heterojunction

Journal

ACS NANO
Volume 9, Issue 10, Pages 9849-9858

Publisher

AMER CHEMICAL SOC
DOI: 10.1021/acsnano.5b03017

Keywords

optoelectronics; scanning photocurrent microscopy; photocurrents; heterojunctions; nanowires

Funding

  1. European Research Council (ERC) [306754]
  2. IGGSE
  3. European Research Council (ERC) [306754] Funding Source: European Research Council (ERC)

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We investigate the optoelectronic properties of single indium arsenide nanowires, which are grown vertically on p-doped silicon substrates. We apply a scanning photocurrent microscopy to study the optoelectronic properties of the single heterojunctions. The measured photocurrent characteristics are consistent with an excess charge carrier transport through midgap trap states, which form at the Si/InAs heterojunctions. Namely, the trap states add an additional transport path across a heterojunction, and the charge of the defects changes the band bending at the junction. The bending gives rise to a photovoltaic effect at a small bias voltage. In addition, we observe a photoconductance effect within the InAs nanowires at large biases.

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