Journal
CURRENT GENOMICS
Volume 14, Issue 2, Pages 111-126Publisher
BENTHAM SCIENCE PUBL LTD
DOI: 10.2174/1389202911314020004
Keywords
Durable resistance; Genechips; Gene expression; Microarray; Puccinia striiformis; Yellow rust
Funding
- US Department of Agriculture (USDA), Agricultural Research Service (ARS) [5348-22000-014-00D]
- USDA-ARS Post doctoral Program
- Washington Grain Commission [13C-3061-3925]
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Stripe rust of wheat, caused by Puccinia striiformis f. sp. tritici, continues to cause severe damage worldwide. Durable resistance is necessary for sustainable control of the disease. High-temperature adult-plant (HTAP) resistance, which expresses when the weather becomes warm and plants grow older, has been demonstrated to be durable. We conducted numerous studies to understand the molecular mechanisms of different types of stripe rust resistance using a transcriptomics approach. Through comparing gene expression patterns with race-specific, all-stage resistance controlled by various genes, we found that a greater diversity of genes is involved in HTAP resistance than in all-stage resistance. The genes involved in HTAP resistance are induced more slowly and their expression induction is less dramatic than genes involved in all-stage resistance. The high diversity of genes and less dramatic induction may explain durability and the incomplete expression level of HTAP resistance. Identification of transcripts may be helpful in identifying resistance controlled by different genes and in selecting better combinations of genes to combine for achieving adequate and durable resistance.
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