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Impurity substitution effects in BiFeO3 thin films-From a viewpoint of FeRAM applications

Journal

CURRENT APPLIED PHYSICS
Volume 12, Issue 3, Pages 603-611

Publisher

ELSEVIER
DOI: 10.1016/j.cap.2011.12.019

Keywords

BiFeO3; Ferroelectric; FeRAM; Leakage current; Fatigue; La; Mn; Impurity

Funding

  1. WCU (World Class University) through NRF (National Research Foundation)
  2. Ministry of Education, Science and Technology, Republic of Korea [R31-2008-000-10057-0]
  3. National Research Foundation of Korea [R31-2012-000-10057-0] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

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Impurity substitution effects in BiFeO3 thin films are reviewed from a viewpoint of FeRAM (ferroelectric random access memory) applications, in which such characteristics as a large remanent polarization, a low coercive voltage, and excellent fatigue endurance are most important. First, it is described that substitution experiments for Bi and Fe atoms in the films have already been conducted using almost all rare earth and transition metal elements. A list of the published paper is given in a form of the periodic table of elements. Then, two typical cases, La substitution for the Bi site and Mn substitution for the Fe site, are reviewed in detail. Particular attention is paid to the role of these impurity atoms by which the ferroelectric and insulating properties of BiFeO3 films are significantly improved. Finally, impurity effects due to substitution or co-substitution of other elements are reviewed. (C) 2011 Elsevier B. V. All rights reserved.

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