Journal
CURRENT APPLIED PHYSICS
Volume 10, Issue 2, Pages 565-569Publisher
ELSEVIER
DOI: 10.1016/j.cap.2009.07.023
Keywords
Polycrystalline; Cu2ZnSnS4 (CZTS) thin films; Pulsed laser deposition (PLD); X-ray diffraction (XRD); Field emission scanning electron microscopy (FE-SEM); Optical absorption
Funding
- Korean Ministry of Education, Science and Technology (MEST) [K20824000005-08B1200-00510]
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The polycrystalline Cu2ZnSnS4 (CZTS) thin films have been prepared by pulsed laser deposition (PLD) method at room temperature. The laser incident energy was varied from 1.0 at the interval of 0.5-3.0 J/cm(2). The effect of laser incident energy on the structural, morphological and optical properties of CZTS thin films was studied by means of X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), and optical absorption. The studies reveal that an improvement in the structural, morphological and optical properties of CZTS thin films with increasing laser incident energy up to 2.5 J/cm(2). However, when the laser incident energy was further increased to 3.0 J/cm(2), leads to degrade the structural, morphological and optical properties of the CZTS thin films. (C) 2009 Elsevier B.V. All rights reserved.
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