Journal
CRYSTENGCOMM
Volume 14, Issue 5, Pages 1637-1640Publisher
ROYAL SOC CHEMISTRY
DOI: 10.1039/c2ce06315h
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Funding
- MICINN, Spain [TEC2008-04718, PIB2010JP-00279, TEC2011-28076-C02-01]
- FCT, Portugal [PTDC/CTM/100756/2008, SFRH/BPD/74095/2010]
- Centre of Micro-Analysis of Materials
- Fundação para a Ciência e a Tecnologia [SFRH/BPD/74095/2010] Funding Source: FCT
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High quality 1 mu m thick a-plane MgxZn1-xO layers were produced by molecular beam epitaxy with Mg contents higher than 50%. Resonant Rutherford backscattering spectrometry combined with ion channeling revealed a uniform growth in both composition and atomic order. The lattice-site location of Mg, Zn and O elements was determined independently, proving the substitutional behaviour of Mg in Zn-sites of the wurtzite lattice. X-Ray diffraction pole figure analysis also confirms the absence of phase separation. Optical properties at such high Mg contents were studied in Schottky photodiodes.
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