Journal
CONTEMPORARY PHYSICS
Volume 52, Issue 4, Pages 293-318Publisher
TAYLOR & FRANCIS LTD
DOI: 10.1080/00107514.2011.589662
Keywords
X-ray microscopy; X-ray diffraction; X-ray optics; phase-contrast
Categories
Funding
- Office of Science, Office of Basic Energy Sciences, of the US Department of Energy [DE-AC02-05CH11231, DE-AC02-06CH11357, DE-AC02-98CH10886]
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The development of high brightness X-ray sources and high resolution X-ray optics has led to rapid advances in Xray microscopy. Scanning microscopes and full-field instruments are in operation at synchrotron light sources worldwide, and provide spatial resolution routinely in the 25-50 nm range using zone plate focusing elements. X-ray microscopes can provide elemental maps and/or chemical sensitivity in samples that are too thick for electron microscopy. Lensless techniques, such as diffraction microscopy, holography and ptychography are also being developed. In high resolution imaging of radiation-sensitive material the effects of radiation damage needs to be carefully considered. This article is designed to provide an introduction to the current state and future prospects of X-ray microscopy for the non-expert.
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