Journal
COMPTES RENDUS PHYSIQUE
Volume 14, Issue 8, Pages 667-684Publisher
ELSEVIER FRANCE-EDITIONS SCIENTIFIQUES MEDICALES ELSEVIER
DOI: 10.1016/j.crhy.2013.08.004
Keywords
Domain walls; Piezoresponse force microscopy; Creep; Roughness; Disorder; Out-of-equilibrium
Funding
- Swiss National Science Foundation through the NCCR MaNEP
- University of Geneva
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The competition between elasticity and pinning of an interface in a fluctuating potential energy landscape gives rise to characteristic self-affine roughening and a complex dynamic response to applied forces. This statistical physics approach provides a general framework in which the behaviour of systems as diverse as propagating fractures, wetting lines, burning fronts or surface growth can be described. Domain walls separating regions with different polarisation orientation in ferroelectric materials are another example of pinned elastic interfaces, and can serve as a particularly useful model system. Reciprocally, a better understanding of this fundamental physics allows key parameters controlling domain switching, growth, and stability to be determined, and used to improve the performance of ferroelectric materials in applications such as memories, sensors, and actuators. In this review, we focus on piezoresponse force microscopy measurements of individual ferroelectric domain walls, allowing their static configuration and dynamic response to be accessed with nanoscale resolution over multiple orders of length scale and velocity. Combined with precise control over the applied electric field, temperature, and strain, and the ability to influence the type and density of defects present in the sample, this experimental system has allowed not only a direct demonstration of creep motion and roughening, but provides an opportunity to test less-well-understood aspects of out-of-equilibrium behaviour, and the effects of greater complexity in the structure of both the interface and the disorder landscape pinning it. (C) 2013 Published by Elsevier Masson SAS on behalf of Academie des sciences.
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