4.7 Article

Scanning surface potential microscopy of spore adhesion on surfaces

Journal

COLLOIDS AND SURFACES B-BIOINTERFACES
Volume 92, Issue -, Pages 271-276

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.colsurfb.2011.11.052

Keywords

Atomic force microscopy; Scanning surface potential microscopy; SSPM; Kelvin probe force microscopy; KPFM; Spore adhesion; Spores

Funding

  1. Defense Threat Reduction Agency [HDTRA1-07-1-0035]

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The adhesion of spores of Bacillus anthracis - the cause of anthrax and a likely biological threat - to solid surfaces is an important consideration in cleanup after an accidental or deliberate release. However, because of safety concerns, directly studying B. anthracis spores with advanced instrumentation is problematic. As a first step, we are examining the electrostatic potential of Bacillus thuringiensis (Bt), which is a closely related species that is often used as a simulant to study B. anthracis. Scanning surface potential microscopy (SSPM), also known as Kelvin probe force microscopy (KPFM), was used to investigate the influence of relative humidity (RH) on the surface electrostatic potential of Bt that had adhered to silica, mica, or gold substrates. AFM/SSPM side-by-side images were obtained separately in air, at various values of RH, after an aqueous droplet with spores was applied on each surface and allowed to dry before measurements. In the SSPM images, a negative potential on the surface of the spores was observed compared with that of the substrates. The surface potential decreased as the humidity increased. Spores were unable to adhere to a surface with an extremely negative potential, such as mica. (C) 2011 Elsevier B.V. All rights reserved.

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