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Electric double-layer transistors: a review of recent progress

Journal

JOURNAL OF MATERIALS SCIENCE
Volume 50, Issue 17, Pages 5641-5673

Publisher

SPRINGER
DOI: 10.1007/s10853-015-9121-y

Keywords

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Funding

  1. Australian Research Council [FT140100032]
  2. China Scholarship Council (CSC) [201406410060]

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With the miniaturization of electronic devices, it is essential to achieve higher carrier density and lower operation voltage in field-effect transistors (FETs). However, this is a great challenge in conventional FETs owing to the low capacitance and electric breakdown of gate dielectrics. Recently, electric double-layer technology with ultra-high charge-carrier accumulation at the semiconductor channel/electrolyte interface has been creatively introduced into transistors to overcome this problem. Some interesting electrical transport characteristics such as superconductivity, metal-insulator transition, and tunable thermoelectric behavior have been modulated both theoretically and experimentally in electric double-layer transistors (EDLTs) with various semiconductor channel layers and electrolyte materials. The present article is a review of the recent progress in the EDLTs and the impacts of EDLT technology on modulating the charge transportation of various electronics.

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