4.7 Article

High-Responsivity Low-Voltage 28-Gb/s Ge p-i-n Photodetector With Silicon Contacts

Journal

JOURNAL OF LIGHTWAVE TECHNOLOGY
Volume 33, Issue 4, Pages 820-824

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JLT.2014.2367134

Keywords

Germanium photodetector; optical interconnects; silicon photonics

Funding

  1. IMEC's CORE Partner Program

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We report a high-performance germanium waveguide photodetectors (WPDs) without doping in germanium or direct metal contacts on germanium, grown on and contacted through a silicon p-i-n diode structure. Wafer-scale measurements demonstrate high responsivities larger than 1.0 A/W across the C-band and low dark current of similar to 3 nA at -1 V and similar to 8 nA at -2 V. Owing to its small dimensions, the Ge WPD exhibits a high optoelectrical 3-dB bandwidth of 20 and 27 GHz at low-bias voltages of -1 and -2 V, respectively, which are sufficient for operation at 28 Gb/s. The reduced processing complexity at the tungsten contact plug module combined with the high responsivity makes these Ge WPD devices particularly attractive for emerging low-cost CMOS-Si photonics transceivers

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