Journal
CHEMISTRY LETTERS
Volume 42, Issue 8, Pages 924-926Publisher
CHEMICAL SOC JAPAN
DOI: 10.1246/cl.130152
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Funding
- Core Research of Evolutional Science & Technology (CREST) of the Japan Science and Technology Agency [23245036, 23651116, 23710131]
- Grants-in-Aid for Scientific Research [23245036, 23651116, 23710131] Funding Source: KAKEN
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Reduced graphene oxide (rGO) and reduced graphite oxide (rGtO) were analyzed by X-ray photoelectron spectroscopy. rGO and rGtO were prepared by photochemical, electrochemical, hydrazine-assisted, and thermal reduction of graphene oxide (GO) and graphite oxide (GtO). The number of CH defects increased for the photochemical and electrochemical reduction, whereas a direct increase in the number of C=C bonds was observed for thermal and hydrazine-assisted reduction. Cyclic voltammograms showed that the electrochemical capacitance of rGtO increased with the number of CH defects.
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