Journal
CHEMICAL PHYSICS LETTERS
Volume 456, Issue 4-6, Pages 186-188Publisher
ELSEVIER
DOI: 10.1016/j.cplett.2008.03.049
Keywords
-
Ask authors/readers for more resources
It is demonstrated that formation of nano-voids in the depletion liquid layer on the hydrophobic surfaces may be due to the phenomenon of the contact line tension. The mean radius of 2D circular void is calculated. It coincides with characteristic dimensions of nano-voids in depletion liquid layers on the hydrophobic surfaces reported experimentally. (c) 2008 Elsevier B. V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available