Journal
MICROELECTRONICS RELIABILITY
Volume 40, Issue 1, Pages 171-178Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/S0026-2714(99)00221-8
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In this paper the theoretical analysis of noise sources in Optoelectronic Coupled Devices (OCDs) is given and the relation between typical defects and 1/f, g-r and burst noise is described. According to statistical and experimental results, a threshold to screen potential devices with excess noise is derived, which has been proved theoretically that the screening criterion is reasonable, Moreover, the experimental results show that the method is of practical value. (C) 2000 Elsevier Science Ltd. All rights reserved.
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