Journal
CARBON
Volume 38, Issue 14, Pages 1977-1984Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/S0008-6223(00)00045-2
Keywords
amorphous carbon; X-ray diffraction; crystallite size
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A new technique to obtain structural parameters L-c, L-a and d, of phenol formaldehyde resin char (PFC) from TEM images has been developed. Similar structural parameters were also obtained from XRD technique and a comprehensive comparison of the results from the two techniques was made. The present study shows a good agreement between the results from the two techniques. The TEM technique also provided additional information about the distribution of layer size with stacking number, which can not be obtained from XRD technique. (C) 2000 Elsevier Science Ltd. All rights reserved.
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