Journal
TOPICS IN CATALYSIS
Volume 10, Issue 3-4, Pages 143-155Publisher
SPRINGER/PLENUM PUBLISHERS
DOI: 10.1023/A:1019105310221
Keywords
XAFS physical principles; XAFS data analysis; fitting in R-space; detection of low Z scatterers; phase- and amplitude-corrected Fourier transforms; difference file technique; use of theoretical references
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The physical principles of XAFS spectroscopy are given at a sufficiently basic level to enable scientists working in the field of catalysis to critically evaluate articles dealing with XAFS studies on catalytic materials. The described data-analysis methods provide the basic tools for studying the electronic and structural properties of supported metal, metal-oxide or metal-sulfide catalysts. These methods include (a) fitting in R-space, (b) application of the difference file technique and (c) control of the fit procedure with k(1) and k(3) weighting with the help of phase- and amplitude-corrected Fourier transforms.
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