Journal
CHEMICAL SOCIETY REVIEWS
Volume 30, Issue 1, Pages 26-35Publisher
ROYAL SOC CHEMISTRY
DOI: 10.1039/a802099j
Keywords
-
Categories
Ask authors/readers for more resources
Ion mobility measurements are one of the few methods presently available that can directly probe the structures of relatively large molecules in the gas phase. Here we review the application of ion mobility methods to the elucidation of the structures of semiconductor clusters (Si-n, Ge-n, and Sn-n). We describe the new high-resolution implementation of the technique and the advanced methods of mobility calculations that are crucial for the correct analysis of the experimental data.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available