Electrophysical measurements for strongly aggressive liquid semiconductors

An original experimental technique for simultaneous electrical conductivity and thermo-e.m.f. measurements in a wide temperature range (up to 2000 K) under high pressures (up to 50 MPa) has been developed. Special ceramic measuring cells were designed and constructed for investigation of chemically aggressive liquid semiconductors. Different sources of errors connected with convective flows, jamming signals, systematic deviation of measuring devices and especially diffusion of the liquid sample into the body of the ceramic are analysed and method of elimination are proposed. New results for some liquid metal-chalcogen alloys in comparison with those obtained earlier illustrate advantages of the proposed method.