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Synthesis and characterization of silicon carbide whiskers

CARBON (2001)

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Journal

CARBON
Volume 39, Issue 12, Pages 1929-1930

Publisher

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/S0008-6223(01)00153-1

Keywords

whiskers; X-ray diffraction; infrared spectroscopy; scanning electron microscopy; microstructure

Categories

Chemistry, Physical Materials Science, Multidisciplinary

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