Journal
TOPICS IN CATALYSIS
Volume 18, Issue 1-2, Pages 37-43Publisher
KLUWER ACADEMIC/PLENUM PUBL
DOI: 10.1023/A:1013838428305
Keywords
EXAFS; XRD; in situ; time-resolution; copper; methanol synthesis; rhodium; catalytic partial oxidation; high temperature shift catalyst; promoter; fluorescence XAFS; piezo XAFS
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Advances in the study of catalysts by in situ structural characterization, using X-ray absorption spectroscopy (XAFS) and X-ray diffraction (XRD), have recently been achieved and they are illustrated by reference to several examples. Emphasis in the present overview is laid on the study of catalysts under realistic working conditions and therefore in particular on-Line gas analysis during activation and/or during catalysis. The examples encompass (a) activation of copper-based methanol catalysts, (b) dynamic changes of copper-based catalysts during methanol synthesis conditions, (c) catalytic partial oxidation on Rh/Al2O3 catalysts, and (d) reduction (activation) of copper-promoted high temperature shift catalysts.
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