Journal
CERAMICS INTERNATIONAL
Volume 40, Issue 2, Pages 3139-3144Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.ceramint.2013.09.131
Keywords
Defects; X-ray methods; Electrical properties; Ferroelectric properties
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Funding
- National Institute of Technology, Rourkela, India
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Nb-doped Bi4Ti3O12-SrBi4Ti4O15 intergrowth ceramics have been prepared by modified oxalate route. XRD phase analysis confirmed the formation of single phase compound. Nb-doping does not affect the basic crystal structure of the intergrowth. SEM micrographs showed that the grain size of the ceramics decreases with Nb-doping. The temperature dependence of dielectric constant and losses was investigated in the temperature range 30-800 degrees C and frequency range 1 kHz-1 MHz. With Nb-doping, the T-c of the ferroelectrics reduces and peak permittivity increases. Doping also introduces small relaxor behavior in the ferroelectrics. The dc conductivity of the ceramics decreases with doping. The remnant polarization (P-r) of the intergrowth ferroelectrics is increased with Nb doping. (c) 2013 Elsevier Ltd and Techna Group S.r.l. All rights reserved.
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