Journal
CEMENT & CONCRETE COMPOSITES
Volume 32, Issue 1, Pages 92-99Publisher
ELSEVIER SCI LTD
DOI: 10.1016/j.cemconcomp.2009.08.007
Keywords
Nanoindentation; Statistical analysis; Microstructure
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In their paper, Trtik et al. (2009) identify spurious peaks in the application of statistical nanoindentation technique as a critical obstacle for mechanical phase identification. In this discussion. we show that Trtik et al.'s finding is a consequence of an unrealistic virtual 3-D checkerboard microstructure considered by the authors. These peaks are not a general feature of indentation on multiphase materials, nor can the presence of such peaks be attributed to an intrinsic shortcoming of the grid-indentation technique. We also show that the authors' assertion of the absence of homogeneous material regions extending beyond 3 pm in cementitious materials is groundless. (C) 2009 Elsevier Ltd. All rights reserved.
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