Journal
SOLID STATE COMMUNICATIONS
Volume 121, Issue 6-7, Pages 329-332Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/S0038-1098(02)00017-0
Keywords
ferroelectrics; laser ablation thin films; phase transition
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Polycrystalline thin films of Ba(Sn0.1Ti0.9)O-3 were deposited on Pt coated silicon substrates by pulsed excimer laser ablation technique. The room temperature dielectric constant of the Ba(Sn0.1Ti0.9)O-3 films was 350 at a frequency of 100 kHz. The films showed a slightly diffused phase transition in the range of 275-340 K. The polarization hysteresis behavior confirmed the ferroelectric nature of the thin films. Remanent polarization (P-r) and saturation polarization (P-s) were 1.1 and 3.2 muC/cm(2), respectively. The asymmetric capacitance-voltage curve for Ba(Sn0.1Ti0.9)O-3 was attributed to the difference in the nature of the electrodes. Dispersion in both the real (epsilon(r)') and imaginary (epsilon(r)) parts of the dielectric constant at low frequencies with increase in temperature was attributed to space charge contribution in the complex dielectric constant. (C) 2002 Published by Elsevier Science Ltd.
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