Journal
FERROELECTRICS
Volume 278, Issue -, Pages 651-660Publisher
TAYLOR & FRANCIS LTD
DOI: 10.1080/00150190190027573
Keywords
chevron layer structure; SSFLC; X-ray diffraction; C1 and C2; uniform (U) and twist (T)
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It is generally considered that the symmetric chevron is the lowest energy layer structure. However, we show that for SSFLC devices with a twisted director configuration that an asymmetric layer structure may be preferred. For typical cell parameters, we find that the lowest elastic energy condition is for the apex located at about 1/3 of the cell thickness. In this paper, the effect of cell and material parameters, as well as experimental data will be presented.
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