Imaging of quantum array structures with coherent and partially coherent diffraction

Recent achievements in experimental and computational methods open the possibility of measuring and inverting the diffraction pattern from a finite object of submicrometer size. In this paper the possibilities of such experiments for two-dimensional arrays of quantum dots are discussed. The diffraction pattern corresponding to coherent and partial coherent illumination of a sample was generated. Test calculations based on the iterative algorithms were applied to reconstruct the shape of the individual islands in such a quantum structure directly from its diffraction pattern. It is demonstrated that, in the case of coherent illumination, the correct shape and orientation of an individual island can be obtained. In the case of partially coherent illumination, the correct shape of the particle can be obtained only when the coherence of the incoming beam is reduced to match the size of the island.