Journal
JOURNAL OF CRYSTAL GROWTH
Volume 247, Issue 1-2, Pages 110-118Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/S0022-0248(02)01905-X
Keywords
reflection high-energy electron diffraction; molecular beam epitaxy; halides; oxides
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Epitaxial growth of CoO films was studied using reflection high-energy electron diffraction (RHEED), electron energy loss spectroscopy (EELS), ultraviolet photoelectron spectroscopy (UPS) and Auger electron spectroscopy (AES). The RHEED results indicated that an epitaxial CoO film grew on semiconductor and metal substrates (CoO (001)parallel toGaAs (001), Cu (001), Ag (001) and [100]CoOparallel to[100] substrates) by constructing a complex heterostructure with two alkali halide buffer layers. The AES, EELS and UPS results showed that the grown CoO film had almost the same electronic structure as bulk CoO. We could show that use of alkali halide buffer layers was a good way to grow metal oxide films on semiconductor and metal substrates in an O-2 atmosphere. Tile alkali halide layers not only works as glue to connect very dissimilar materials but also prevents oxidation of metal and semiconductor substrates, (C) 2002 Elsevier Science B.V. All rights reserved.
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