Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 50, Issue 6, Pages 2199-2207Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNS.2003.820742
Keywords
analog single-event effects; laser-induced single-event effects; LM124 operational amplifier; nonlinear absorption; single-event transients
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Carrier generation based on subbandgap two-photon absorption is used to perform three-dimensional mapping of the single-event transient response of the LM124 operational amplifier. Three classes of single-event-induced transients are observed for the input transistor Q20. A combination of experiment and transistor level modeling is used to assign the different classes, of, measured transients to charge collection across specific junctions. The large-amplitude, positive-going transients cannot be assigned to a single junction, and are identified with a collector-substrate photocurrent.
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